发明名称 VERTICAL HEAT PROCESSING DEVICE AND HEAT PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technology that reduces particle contamination when carrying out silicon film formation, for example, the epitaxial growth of silicon on a substrate by using a vertical heat processing device. SOLUTION: A silicon film 3 is precoated in a reaction tube 1 and a wafer boat 21 by silane based gas. Next, a natural oxide film on a surface of a wafer W is removed by mixed gas (HF+NH<SB>3</SB>) after carrying the wafer W into the reaction tube 1, and then, the epitaxial growth is carried out for the wafer W by using the silane based gas. The height position of an aperture end 14a of a third injector 14 for supplying the mixed gas is determined so as to be at a position upper than the silicon film precoated in the reaction tube 1. This allows the reaction tube 1 to be etched by the mixed gas and prevents particles from being generated. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010219494(A) 申请公布日期 2010.09.30
申请号 JP20090293125 申请日期 2009.12.24
申请人 TOKYO ELECTRON LTD 发明人 NORO NAOTAKA;MIYAHARA TAKAHIRO
分类号 H01L21/205;C23C16/44;H01L21/3065 主分类号 H01L21/205
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