| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and its checking method capable of checking an abnormality of a resistance value caused by the rewiring of an input terminal or an output terminal by a simple constitution in a short time. SOLUTION: The semiconductor device has a MOS transistor M1 for protection connected between an input pad or an output pad P2 on a semiconductor chip 10, and a power supply pad P1 (or between the input pad or the output pad P2 and an earth pad P3), and a test signal inputted from an external terminal T4 of the semiconductor device 20 is applied to a gate of the MOS transistor M1 for protection to control whether the input pad or the output pad P2 is connected to the power source pad P1. Furthermore, the semiconductor device 20 includes a rewiring means for connecting the pads P1-P4 of the semiconductor chip 10 and the external terminals T1-T4 of the semiconductor device. The semiconductor device 20 is formed of CSP or WLCSP. COPYRIGHT: (C)2010,JPO&INPIT
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