发明名称 ENHANCED CHARACTERIZATION OF ELECTRICAL CONNECTION DEGRADATION
摘要 One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical connection and applies a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient. Next, the system assesses the integrity of the electrical connection based on the statistical deviation of the reflection coefficient. Finally, the system uses the assessed integrity to maintain the electrical connection.
申请公布号 US2010250158(A1) 申请公布日期 2010.09.30
申请号 US20090415814 申请日期 2009.03.31
申请人 SUN MICROSYSTEMS, INC. 发明人 MCELFRESH DAVID K.;GROSS KENNY C.;LOPEZ LEONCIO D.;VACAR DAN
分类号 G01R31/00;G06F17/18;G06F19/00 主分类号 G01R31/00
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