发明名称 SYSTEM AND METHOD FOR MEASURING DISPLAY QUALITY WITH A HYPERSPECTRAL IMAGER
摘要 A system and method for measuring display quality by using a hyperspectral imager are disclosed. In one embodiment, the system comprises a hyperspectral imager configured to determine an intensity of light for a plurality of locations in a first area on a display for a plurality of spectral channels, and a processor configured to determine a measure of display quality based on the determined intensities.
申请公布号 US2010245833(A1) 申请公布日期 2010.09.30
申请号 US20090410409 申请日期 2009.03.24
申请人 QUALCOMM MEMS TECHNOLOGIES, INC. 发明人 SHAH HEMANG J.
分类号 G01J3/45 主分类号 G01J3/45
代理机构 代理人
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