| 摘要 |
An MR element having a magnetically free layer and a magnetic bias layer that applies a bias magnetic field to the magnetically free layer are included. Furthermore, a measuring section that measures a ferromagnetic resonance frequency f0 of the magnetically free layer under a condition of applying a predetermined external magnetic field Hm to the magnetically free layer, and an operation section that computes the bias magnetic field Hb according to a following conditional expression (1): Hb={(2*&pgr;*f0/γ)2/Ms}−(Hk+Hm)   (1) where γ is a gyroscope constant, Ms is a saturation magnetic field of the magnetically free layer, and Hk is a shape anisotropy magnetic field of the magnetically free layer.
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