发明名称 POWER SOURCE NOISE ANALYSIS DEVICE AND ANALYSIS METHOD
摘要 A power source noise analysis device includes an analysis portion. The analysis portion estimates an internal impedance of a semiconductor chip being an object to be analyzed based on a power current waveform, which is obtained by simulation of the semiconductor chip based on design data of the semiconductor chip. The analysis portion carries out a noise analysis of a power system including a board having the semiconductor chip mounted thereon based on the internal impedance.
申请公布号 US2010250224(A1) 申请公布日期 2010.09.30
申请号 US20090640472 申请日期 2009.12.17
申请人 FUJI XEROX CO., LTD. 发明人 IGUCHI DAISUKE;HORIGUCHI TAKAHIRO
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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