发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce a rate of occurrence of defectives both during cutting and during pickup in a semiconductor device manufacturing process by using a fixing tape that makes cuttability of a semiconductor wafer compatible with pickup properties of semiconductor chips. SOLUTION: An adhesive film 6 is stuck onto a second face (a grinding face) 1b of a semiconductor wafer 1. Then, a fixing tape 8 stretched on a wafer ring 7 is stuck onto the second face 1b of the semiconductor wafer 1 via the adhesive film 6. The fixing tape has a first soft region A1 corresponding to a wafer shape, and a second hard region A2 including a part fixed to the wafer ring 7. Semiconductor chips are formed by cutting the semiconductor wafer 1 together with the adhesive film 6. Subsequently, the semiconductor chips are picked up from the fixing tape so as to bond them onto a device constituting base material. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010219267(A) 申请公布日期 2010.09.30
申请号 JP20090063966 申请日期 2009.03.17
申请人 TOSHIBA CORP 发明人 MIYASHITA KOICHI
分类号 H01L21/301;H01L21/52 主分类号 H01L21/301
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