发明名称 METHODS AND SYSTEMS OF DETERMINING RISK LEVELS OF ONE OR MORE SOFTWARE INSTANCE DEFECTS
摘要 An exemplary method includes displaying a graphical user interface configured to facilitate identification of one or more defects within a software instance, receiving data representative of at least one instruction via the graphical user interface to assign a severity risk value, an impact risk value, and a likelihood risk value to each of the one or more defects, and generating a defect risk factor corresponding to each of the one or more defects that indicates a risk level of each of the one or more defects, the generating based on a combination of the severity risk value, the impact risk value, and the likelihood risk value corresponding to each of the one or more defects.
申请公布号 US2010251215(A1) 申请公布日期 2010.09.30
申请号 US20090413745 申请日期 2009.03.30
申请人 VERIZON PATENT AND LICENSING INC. 发明人 YAWALKAR SHRIRANG V.;KUMAR BALAJI
分类号 G06F9/44 主分类号 G06F9/44
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