| 摘要 |
Provided is a transfer characteristic measurement apparatus that measures a transfer characteristic of a circuit under test between input and output, comprising a test signal input section that generates a test signal by adding together a carrier signal having a prescribed frequency and an additional signal having a frequency that differs from the prescribed frequency, and inputs the test signal to the circuit under test; and a transfer characteristic measuring section that measures the transfer characteristic of the circuit under test at the frequency of the additional signal based on a result from a measurement of an output signal output by the circuit under test. The circuit under test may be formed on a semiconductor chip. The circuit under test may correct a signal input to the semiconductor chip, and outputs the corrected signal. The semiconductor chip may further include a sampling circuit that samples the output signal of the circuit under test at the frequency of the carrier signal.
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