| 摘要 |
PROBLEM TO BE SOLVED: To reduce the operation time by optimally selecting whether DSP modules are executed successively, or in parallel, according to the operation processing. SOLUTION: A semiconductor-testing device includes a DSP module 4 including a plurality of CPUs; and a tester controller 3 for controlling the DSP module 4, according to a test program where operation processing has been described. The semiconductor-testing device includes an operation mode selection section 15, that is provided in the test controller 3 and selects one operation mode from a single mode for allowing the DSP module 4 to successively execute operation processing and a multi-mode for allowing the DSP module to execute operation processings in parallel, based on the operation processing described in the test program; and a CPU control section 24 that is provided in the DSP module 4 and selects whether one CPU is operated successively less than two CPUs are operated in parallel, based on the selection of the operation mode selection section 15. COPYRIGHT: (C)2010,JPO&INPIT
|
