发明名称 Polishing Composition and Polishing Method
摘要 In a polishing composition, the concentration of one of either sodium ions or acetate ions is 10 ppb or less, or the concentrations of sodium ions and acetate ions are 10 ppb or less. The polishing composition preferably contains a water soluble polymer such as hydroxyethylcellulose, an alkali such as ammonia, and abrasive grains such as colloidal silica. The polishing composition is mainly used in polishing of the surfaces of semiconductor wafers such as silicon wafers, especially used in finish polishing of the surfaces of such wafers.
申请公布号 US2010242374(A1) 申请公布日期 2010.09.30
申请号 US20100816996 申请日期 2010.06.16
申请人 FUJIMI INCORPORATED 发明人 NOGUCHI NAOTO;KOTAMA KAZUTOSHI;NIWANO YUTAKA
分类号 C09K3/14;B24B37/00;H01L21/304 主分类号 C09K3/14
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