发明名称 SEMICONDUCTOR DEVICE THERMAL CONNECTION
摘要 A semiconductor device thermal connection used to remove heat from a semiconductor device, such as an integrated circuit, includes a metallic barrier layer on the semiconductor device, and a high thermal conductivity material on the metallic barrier layer that joins the semiconductor device to a thermal heat spreader. The metallic barrier layer may be one or more sputtered layers, and the high thermal conductivity material may be a metallic material, for instance including indium, that is soldered onto the sputtered material. The high thermal conductivity material may form a primary thermal connection in conducting heat away from the semiconductor device. A secondary thermal connection may be made between the heat spreader and a heat sink. The secondary thermal connection may include a compressible solid carbon fiber material. A diaphragm may be used to contain the carbon fiber material, to prevent carbon fibers from coming into contact with the semiconductor device.
申请公布号 EP2232550(A1) 申请公布日期 2010.09.29
申请号 EP20080859200 申请日期 2008.10.03
申请人 RAYTHEON COMPANY 发明人 DRAKE, PETER;BOYACK, CHAD E.;PAULSON, KEVIN A.;FAORO, JAMES E.;NELSON KONEN, CYNTHIA R.;PETERSON, STEVEN N.;CUNNINGTON, GEORGE R.;MYERS, JAMES R.
分类号 H01L23/373 主分类号 H01L23/373
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