发明名称 Highly integrated semiconductor device and method of fabricating the same
摘要 A method of fabricating a semiconductor device includes sequentially forming a first pattern and a second pattern on a substrate, the second pattern being a non-single-crystalline semiconductor stacked on the first pattern, wherein a portion of the substrate is exposed adjacent to the first and second patterns, forming a non-single-crystalline semiconductor layer on the substrate, the semiconductor layer contacting the second pattern and the exposed portion of the substrate, and, using the substrate as a seed layer, changing the crystalline state of the semiconductor layer to be single-crystalline and changing the crystalline state of the second pattern to be single-crystalline.
申请公布号 US7803697(B2) 申请公布日期 2010.09.28
申请号 US20060600719 申请日期 2006.11.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SUNG-MIN;YUN EUN-JUNG
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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