DEFECTIVE CELL DETECTING METHOD AND CIRCUIT FOR USE IN SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: A defective cell detection method and a defective cell detection circuit for a semiconductor memory device are detect the location of defective cells by selecting each bit from read test data from a memory core and outputting the selected bit to an output pad. CONSTITUTION: A memory core(12) is connected with a sense amplifying circuit(13). The sense amplifying circuit is connected with a single bit data outputting unit(14) through a first switching unit(S1). The single bit data outputting unit is connected with an output pad(15) through a switching unit(S2). An internal circuit controller(11) transmits a control signal to an internal configuration circuit and controls the internal configuration circuit.