RELIABILITY EVALUATION CIRCUIT AND RELIABILITY EVALUATION SYSTEM

摘要

PURPOSE: A reliability evaluation circuit and a reliability evaluation system are provided to reduce a time for evaluating the reliability by applying stress voltages with a plurality of different voltage levels to a plurality of device units. CONSTITUTION: A stress voltage generating block(110) outputs a plurality of stress voltages with different voltage levels through a plurality of first input/output(IO) terminals. A stress device array(120) connects one terminal with one of the first IO terminals. The other terminal of the stress device array is connected with one of second IO terminals. A plurality of device units is arranged in a matrix shape.