发明名称 PHOTOMASK AND METHOD OF MANUFACTURING THE PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a photomask provided with a non-resolution pattern having a desired pattern shape by preventing a resist pattern for forming the non-resolution pattern from falling into a state which differs from a desired shape and being transferred to a metal film on the photomask, in this state. <P>SOLUTION: The photomask includes a resolution pattern 1 for wiring and a non-resolution pattern 2 which is disposed apart from the resolution pattern 1 for wiring, in order to correct an optical adjacency effect of the resolution pattern 1 for wiring, and the non-resolution pattern 2 has a shape curved along its lengthwise direction, in plan view. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010211121(A) 申请公布日期 2010.09.24
申请号 JP20090059515 申请日期 2009.03.12
申请人 ELPIDA MEMORY INC 发明人 TAGAWA FUMITAKE
分类号 G03F1/36;G03F1/68;H01L21/027 主分类号 G03F1/36
代理机构 代理人
主权项
地址