发明名称 |
PRODUCTION METHOD OF SEMICONDUCTOR COMPOSITE DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a production method of a semiconductor composite device, wherein a high-quality nitride single crystal semiconductor layer having good flatness is joined to the surface of a second substrate. <P>SOLUTION: The production method of the semiconductor composite device includes: a first step of forming a first nitride single crystal semiconductor layer 102 including an indium nitride layer on the surface of a base substrate 101; a second step of forming a second nitride single crystal semiconductor layer 103 on the surface of the first nitride single crystal semiconductor layer; a third step of patterning the second nitride single crystal semiconductor layer; a fourth step of forming a protective layer covering the patterned second nitride single crystal semiconductor layer 113; a fifth step of modifying the indium nitride layer into a metal indium layer by exposing the first nitride single crystal semiconductor layer to active hydrogen; a sixth step of peeling the second nitride single crystal semiconductor layer from the first substrate by etching the metal indium layer; and a seventh step of joining the peeled second nitride single crystal semiconductor layer to the surface of a second substrate. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010208897(A) |
申请公布日期 |
2010.09.24 |
申请号 |
JP20090057176 |
申请日期 |
2009.03.10 |
申请人 |
OKI DATA CORP;OKI DIGITAL IMAGING CORP |
发明人 |
OGIWARA MITSUHIKO;IGARI YUUKI;SAKUTA MASAAKI;HASHIMOTO AKIHIRO |
分类号 |
C30B29/38;C30B25/04;C30B33/06;H01L33/32 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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