发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a PMISFET (P Channel Metal Insulator Field Effect Transistor) in a metal gate electrode having a low threshold voltage. SOLUTION: The method of manufacturing the PMISFET on a semiconductor substrate 10 includes the processes of: forming an insulating film 20 on the semiconductor substrate 10; forming an adsorption layer 110 on the insulating film 20 by exposing the semiconductor substrate 10 and insulating film 20 to gas containing a halogen compound; forming a gate electrode 40 containing metal on the adsorption layer 110 and subjecting the adsorption layer 110 and gate electrode 40 to reaction with each other to convert the adsorption layer 110 into a halogen-containing metal layer. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010212376(A) 申请公布日期 2010.09.24
申请号 JP20090055536 申请日期 2009.03.09
申请人 TOSHIBA CORP 发明人 NISHINO HIROTAKE
分类号 H01L29/78;H01L21/288;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;H01L29/49 主分类号 H01L29/78
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