发明名称 PSEUDO FAULT GENERATING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a pseudo fault generating apparatus capable of reproducing the state detected by electronic equipment that faults may be generated in a plurality of units at an optional timing. <P>SOLUTION: The pseudo fault generating apparatus 110 is applied to the electronic equipment 100 including the plurality of units 101, 102, .... The pseudo fault generating apparatus 110 accepts fault generation information including the unit specification information for specifying the units 101, 102, ... and the timing information indicating the timing of fault generation. The pseudo fault generating apparatus 110 generates a pseudo fault at the unit specified by the unit specification information included in the fault generation information at the timing indicated by the timing information contained in the accepted fault generation information. Thereby, at an optional timing, the state detected by the electronic equipment 100 can be reproduced that the faults may be generated at the plurality of units 101, 102, .... <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010211344(A) 申请公布日期 2010.09.24
申请号 JP20090054438 申请日期 2009.03.09
申请人 NEC CORP 发明人 TAKESHITA YUICHI
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
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