发明名称 REFRACTIVE INDEX METER
摘要 <P>PROBLEM TO BE SOLVED: To easily and precisely provide an absolute value of a refractive index of a sample. Ž<P>SOLUTION: A medium layer covering a grating layer 4 of a waveguide mode resonance filter 50 is prepared as the sample S, and an end face of a waveguide layer 3 is irradiated with monochromatic light, and emitted light therefrom is detected by a detector 14, and an emission spectrum is created by a data processing part. A resonance peak, showing a high emission rate, appears in the emission spectrum, and the angle and the wavelength of the resonance peak depend on the real part of the refractive index of the sample S, and the intensity of the resonance peak depends on the imaginary part of the refractive index of the sample S. Accordingly, the refractive index of the sample is obtained from the wavelength, the angle and the intensity of the detected resonance peak. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010210384(A) 申请公布日期 2010.09.24
申请号 JP20090056225 申请日期 2009.03.10
申请人 SHIMADZU CORP 发明人 SATO AKIRA
分类号 G01N21/41;G01N21/27 主分类号 G01N21/41
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