发明名称 APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a method for approaching a probe and a sample, surely approaching them without a damage, as well as shortening a time required for approaching. SOLUTION: In detecting a displacement of a cantilever 2 by a displacement detecting mechanism 5 and allowing a probe 1 and a sample 8 to approach by a rough movement mechanism 13 or/and a vertical direction fine movement mechanism 11, an excitation mechanism 4 excites the cantilever 2 with a first excitation condition and the probe 1, the sample 8 are allowed to approach with a first stop condition, then the cantilever 2 is excited with a second excitation condition different from the first excitation condition, a second stop condition is set, and the probe 1 and the sample 8 are allowed to approach until the second stop condition by the vertical direction fine movement mechanism 11 or/and the rough movement mechanism 13. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010210609(A) 申请公布日期 2010.09.24
申请号 JP20090267578 申请日期 2009.11.25
申请人 SII NANOTECHNOLOGY INC 发明人 IYOGI MASATO;SHIKAKURA YOSHIAKI;WATANABE MASASHI
分类号 G01Q60/32 主分类号 G01Q60/32
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