发明名称 MEASURING DEVICE AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To speedily measure distribution of transmittance in an object to be observed. Ž<P>SOLUTION: One illustrated embodiment of a measuring device includes: observation means (11, 13, 15, 17) for acquiring both of dark field images and bright field images from the object (25a) to be observed; a storage means for storing information indicating scattering efficiency of the object to be observed beforehand; and an arithmetic operation means for calculating the distribution of transmittance of the object to be observed, based on the dark field images and bright field images acquired by the observation means and information stored by the storage means in advance. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010210506(A) 申请公布日期 2010.09.24
申请号 JP20090058417 申请日期 2009.03.11
申请人 NIKON CORP 发明人 TSUKAMOTO HIROYUKI
分类号 G01N21/59;G01N21/17 主分类号 G01N21/59
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