| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce time required for reading data from devices to be controlled, and to return correct data when a read request to the devices to be controlled occurs from a control section during write in a semiconductor-testing device including the control sections having a fast data transfer speed and the devices to be controlled having a slow data transfer speed while having a register or a memory in the inside. Ž<P>SOLUTION: When the control section (10) performs a write request to the devices (21, ...) to be controlled, memories (51, ...) for read store write data in parallel with storage of a write address and write data transmitted by the control section in buffer memories (41, ...) and store data that are entirely or partially identical to the content of the internal register or memory in the devices to be controlled. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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