| 摘要 |
PROBLEM TO BE SOLVED: To effectively carry out a memory test at a low cost for a semiconductor device, including a semiconductor memory. SOLUTION: In a test burn-in apparatus, twenty-four test boards are sequentially processed while keeping a time difference, and each test board is circulated one by one. In the above case, the memory test is carried out through a sheetfed processing sequence, in which the test is started from a test board which finishes mounting a semiconductor device, and a semiconductor device is removed from a test board whose test is finished. COPYRIGHT: (C)2010,JPO&INPIT
|
