发明名称 Duty detection circuit, clock generation circuit including the duty detection circuit, and semiconductor device
摘要 To provide a duty detection circuit including: a plurality of duty detectors that detect a duty ratio of internal clocks; a controller that controls the plurality of duty detectors so that the plurality of duty detectors operates in different phases from one another; and an output selecting unit that selects one of duty detection signals from the plurality of duty detectors. According to the present invention, since the duty detectors operate in the different phases from one another, the output selecting unit can output a duty detection signal with a higher frequency than a generation frequency with which each duty detector generates the duty detection signal. Accordingly, when the duty detection circuit according to the present invention is used to adjust a clock of the DLL circuit, a control period of the DLL circuit can be reduced.
申请公布号 US2010237917(A1) 申请公布日期 2010.09.23
申请号 US20100659551 申请日期 2010.03.12
申请人 ELPIDA MEMORY, INC. 发明人 MONMA ATSUKO
分类号 H03L7/06;H03K3/017 主分类号 H03L7/06
代理机构 代理人
主权项
地址