发明名称 SELECTIVE FABRICATION OF HIGH-CAPACITANCE INSULATOR FOR A METAL-OXIDE-METAL CAPACITOR
摘要 Methods and devices of a capacitor in a semiconductor device having an increased capacitance are disclosed. In a particular embodiment, a method of forming a capacitor is disclosed. A section of a first insulating material between a first metal contact element and a second metal contact element is removed to form a channel. A second insulating material is deposited in the channel between the first metal contact element and the second metal contact element.
申请公布号 WO2010107772(A2) 申请公布日期 2010.09.23
申请号 WO2010US27450 申请日期 2010.03.16
申请人 QUALCOMM INCORPORATED;KANG, WOO, TAG;KIM, JONGHAE;SUH, JUNGWON 发明人 KANG, WOO, TAG;KIM, JONGHAE;SUH, JUNGWON
分类号 H01L27/108;H01L27/04 主分类号 H01L27/108
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