发明名称 LIQUID METAL ION SOURCE, SECONDARY IION MASS SPECTROMETER,SECONDARY ION MASS SPECTROMETRIC ANALYSIS METHOD AND USE THEREOF
摘要 A mass spectrometric method according to the Gentle SIMS (G-SIMS) method uses a liquid metal ion source which contains, on the one hand, a first metal with an atomic weight≧190 U and, on the other hand, another metal with an atomic weight≰90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
申请公布号 US2010237234(A1) 申请公布日期 2010.09.23
申请号 US20080739993 申请日期 2008.10.16
申请人 ION-TOF TECHNOLOGIES GMBH 发明人 KOLLMER FELIX;HOERSTER PETER;DUETTING ANDREAS
分类号 H01J49/26;H01J49/10;H01J49/40;H01J49/42 主分类号 H01J49/26
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