发明名称 PROCESS FOR STRIPPING PHOTORESIST AND REMOVING DIELECTRIC LINER
摘要 A process of stripping a patterned photoresist layer and removing a dielectric liner includes performing an oxygen-containing plasma dry etch process and performing a fluorine-containing plasma dry etch process in the same reaction chamber at a process temperature less than 120° C.
申请公布号 US2010240220(A1) 申请公布日期 2010.09.23
申请号 US20100721961 申请日期 2010.03.11
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHIU YI-WEI;CHIU YIH SONG;WENG TZU CHAN;HER JENG CHANG
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项
地址