| 摘要 |
A system open testing method is provided. Firstly, a system to be tested having at least an ESD protection unit, a signal input pad, a first voltage level end, and a second voltage level end is provided, wherein the first voltage level end and the second voltage level end are utilized for accessing electric power, the ESD protection unit has one end coupled to the signal input pad and the other end coupled to the first voltage level end. Afterward, a diode is connected to the signal input pad, and the conducting direction of the diode is opposite to that of the interior diode in the ESD circuit. Thereafter, a testing signal is send through the diode to the system.
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