发明名称 METHODS FOR FORMING METAL GATE TRANSISTORS
摘要 A method for cleaning a diffusion barrier over a gate dielectric of a metal-gate transistor over a substrate is provided. The method includes cleaning the diffusion barrier with a first solution including at least one surfactant. The amount of the surfactant of the first solution is about a critical micelle concentration (CMC) or more. The diffusion barrier is cleaned with a second solution. The second solution has a physical force to remove particles over the diffusion barrier. The second solution is substantially free from interacting with the diffusion barrier.
申请公布号 US2010240204(A1) 申请公布日期 2010.09.23
申请号 US20100719532 申请日期 2010.03.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEH MATT;LIN SHUN WU;OUYANG HUI
分类号 H01L21/28;B08B3/00;H01L21/302 主分类号 H01L21/28
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