发明名称 TESTING METHOD OF SEMICONDUCTOR LASER AND LASER TESTING DEVICE
摘要 A testing method of a semiconductor laser emitting a wavelength under a test different from a reference wavelength in a given wavelength range includes: a first step of obtaining a length of an optical fiber under the test satisfying a reference dispersion condition at the wavelength under the test, based on the reference dispersion condition for the test and a unit dispersion amount of the optical fiber; and a second step of inputting a modulation signal that is a modulated laser light of the semiconductor laser having a wavelength as the wavelength under the test into an optical fiber having substantially the same length as the length obtained in the first step and evaluating an output of the optical fiber.
申请公布号 US2010238426(A1) 申请公布日期 2010.09.23
申请号 US20100726015 申请日期 2010.03.17
申请人 SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC. 发明人 ONO HARUYOSHI;BABA ISAO;SUGIYAMA MAKOTO
分类号 G01J3/00 主分类号 G01J3/00
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