发明名称 |
Method for production of integrated circuit with low-resistance contacts |
摘要 |
<p>Integrated circuit arrangement (48) comprises a semiconductor substrate (52), a metallic connecting region (102), and a semiconductor layer (84) arranged between the substrate and the connecting region. A transition layer (210) lying parallel to the surface of the substrate is penetrated by several partial regions of the material layer and/or several partial regions of the connecting region. The partial regions of the material layer in the transition layer are each completely surrounded by metallic material. The transition layer is more than 10 nm thick. An independent claim is also included for a process for the production of the integrated circuit arrangement.</p> |
申请公布号 |
EP2230684(A2) |
申请公布日期 |
2010.09.22 |
申请号 |
EP20100168883 |
申请日期 |
2004.06.02 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
HOFMANN, FRANZ;LUYKEN, RICHARD JOHANNES;ROESNER, WOLFGANG;SPECHT, MICHAEL |
分类号 |
H01L21/285;H01L21/60;H01L29/417 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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