发明名称 METHOD OF PREPARING TRANSPARENT OHMIC CONTACT STRUCTURE BeO/Au/BeO/p-GaN
摘要 FIELD: physics. ^ SUBSTANCE: method of preparing a transparent ohmic contact structure BeO/Au/BeO/p-GaN involves ion-plasma cleaning of the surface of an epitaxial p-GaN layer and then heating the surface to temperature of 350-370C and depositing an ohmic contact consisting of a BeO layer with p-type conductivity and thickness of 2.8-3.2 nm, a gold layer with thickness of 3.8-4.2 nm and a second BeO layer with thickness of 3.0-4.0 nm. After ion-plasma cleaning and before depositing the first BeO layer on the surface of the heated epitaxial p-GaN layer, an aluminium oxide layer with thickness of not less than 30% of the thickness of the epitaxial p-GaN layer is deposited and then removed. ^ EFFECT: minimisation of defects of the growth structure and increased stability of the said transparent contact structure. ^ 2 dwg
申请公布号 RU2399986(C1) 申请公布日期 2010.09.20
申请号 RU20090101266 申请日期 2009.01.16
申请人 UCHREZHDENIE ROSSIJSKOJ AKADEMII NAUK INSTITUT OBSHCHEJ I NEORGANICHESKOJ KHIMII IM. N.S. KURNAKOVARAN (IONKH RAN);GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "MOSKOVSKIJ GOSUDARSTVENNYJ INSTITUT RADIOTEKHNIKI, EHLEKTRONIKII AVTOMATIKI (TEKHNICHESKIJ UNIVERSITET)" (MIREHA) 发明人 BESPALOV ALEKSEJ VIKTOROVICH;EVDOKIMOV ANATOLIJ ARKAD'EVICH;KETSKO VALERIJ ALEKSANDROVICH;STOGNIJ ALEKSANDR IVANOVICH
分类号 B82B3/00;H01L21/28 主分类号 B82B3/00
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