| 摘要 |
PURPOSE: A contact for a test socket and a test socket having the same are provided to supply contact or cylinder column of a plurality of helix conductive members, thereby replacing an existing contact. CONSTITUTION: A cylindrical column(30a) is forms by a plurality of helix type conductive members(31). To allow center to form a hollow type, each helix conductive members is arranged continuously on one direction according to virtual axis line. To allow both end of cylindrical column to be expose to external side, a elastic supporting member(32) is unified to hollow area and surrounding area between the both side of the cylindrical column. If the sylindrical comun shrinks or restores by semiconductor package, the elastic supporting member reinforces the elastic power of the cylindrical column. |
