| 摘要 |
FIELD: physics. ^ SUBSTANCE: device has a heat chamber with apparatus for supplying steam-air medium, passive and active clamps for the test material sample, a passive clamp displacement sensor, a mechanism for loading the test sample, a microprocessor, a microcontroller, a matching unit and a measuring system. The device also has a pulse-width modulator and a field-effect transistor. The measuring system which is commutated with the microprocessor is made in form of an electromechanical drive whose output link is connected to the passive clamp of the test sample through a power transmission under the condition for balance of basic moments - provided by said power transmission and created by initial force applied to the test sample. The microcontroller is commutated with the pulse-width modulator, controlled passive clamp displacement sensor under the condition for energy balance of the level of signals provided by the stressed state of the sample and coming from the electromechanical drive. ^ EFFECT: simplification of the device, more reliable operation of the device and higher measurement accuracy. ^ 2 dwg |
