METHOD AND DEVICE FOR MEASURING PERMITTIVITY AND/OR PERVIOUSNESS

摘要

The invention relates to a method for measuring the permittivity and/or perviousness of a sample of a nonconductive material, said method comprising: a) measuring (94) a value representative of an admittance Ytestco, measuring a (98) a value representative of an admittance Ytestcc only from the amplitude and the phase of the electromagnetic waves reflected onto an interface between the sample and the end of a second waveguide having at least one conductive web separated from a conductive sheath by a layer of dielectric material, said second waveguide also including a short circuit between the central web and the sheath at the interface with the sample, and c) calculating (100) the permittivity of the sample from the values representative of the admittances Ytestco and Ytestcc and/or calculating (100) the perviousness of the sample from the values representative of the admittances Ytestco and Ytestcc.