发明名称 FILM DEPOSITION METHOD, AND METHOD OF MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a film deposition method capable of forming a few defect density film of silicon dioxide by a low temperature process without using film deposition under a vacuum atmosphere. <P>SOLUTION: The method includes the steps of; forming a silicon film 13 by applying a solution containing a polysilane compound on a substrate 11 to form a coating film 12, and then by subjecting the coating film 12 to a first thermal treatment in an inert atmosphere; forming a silicon dioxide precursor film 15 by forming a coating film 14 containing the polysilane compound on the silicon film 13, and then by subjecting the coating film 14 to a second thermal treatment in an oxidizing atmosphere; and forming a silicon dioxide film 16 by subjecting the silicon dioxide precursor film 15 to a third thermal treatment in an oxidizing atmosphere and thereby densifying the silicon film 13. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010206161(A) 申请公布日期 2010.09.16
申请号 JP20090216362 申请日期 2009.09.18
申请人 SONY CORP 发明人 AKAO HIROTAKA;KAINO YURIKO;KURIHARA KENICHI;HARA MASATERU;KAMEI TAKAHIRO
分类号 H01L21/316;H01L21/336;H01L29/786 主分类号 H01L21/316
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