发明名称 |
FILM DEPOSITION METHOD, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a film deposition method capable of forming a few defect density film of silicon dioxide by a low temperature process without using film deposition under a vacuum atmosphere. <P>SOLUTION: The method includes the steps of; forming a silicon film 13 by applying a solution containing a polysilane compound on a substrate 11 to form a coating film 12, and then by subjecting the coating film 12 to a first thermal treatment in an inert atmosphere; forming a silicon dioxide precursor film 15 by forming a coating film 14 containing the polysilane compound on the silicon film 13, and then by subjecting the coating film 14 to a second thermal treatment in an oxidizing atmosphere; and forming a silicon dioxide film 16 by subjecting the silicon dioxide precursor film 15 to a third thermal treatment in an oxidizing atmosphere and thereby densifying the silicon film 13. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010206161(A) |
申请公布日期 |
2010.09.16 |
申请号 |
JP20090216362 |
申请日期 |
2009.09.18 |
申请人 |
SONY CORP |
发明人 |
AKAO HIROTAKA;KAINO YURIKO;KURIHARA KENICHI;HARA MASATERU;KAMEI TAKAHIRO |
分类号 |
H01L21/316;H01L21/336;H01L29/786 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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