发明名称 METHOD FOR MONITORING FABRICATION PARAMETER
摘要 A method for monitoring fabrication parameters comprises steps of: obtaining a normal parameter variance curve and a comparing parameter variance curve; defining a plurality of normal parameter points on the normal parameter variance curve; defining a plurality of comparing parameter points on the comparing parameter variance curve; finding out the corresponding comparing parameter points nearest to the normal parameter points; calculating the distances between the normal parameter points and the corresponding comparing parameter points thereof; summing up the distances so as to receive a total distance; and determining whether or not the total distance exceeds a limit. Via this arrangement, when fabrication parameter of tool is abnormal, it can be efficiently and immediately determined.
申请公布号 US2010233830(A1) 申请公布日期 2010.09.16
申请号 US20090469051 申请日期 2009.05.20
申请人 INOTERA MEMORIES, INC. 发明人 LEE YI FENG;CHEN CHUN CHI;TIAN YUN-ZONG;CHEN WEI JUN
分类号 H01L21/66 主分类号 H01L21/66
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