发明名称 MASS ANALYSIS-USE MEASUREMENT SAMPLE AND PREPARING METHOD FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a mass analysis-use measurement sample and a preparing method for the same, which dramatically increase an ionization efficiency of a sample containing a measurement object molecule in a laser irradiation operation, and bring a sweet spot to appear easily, or a lot of sweet spots or a wide sweet spot to appear, and to provide a mass analysis for improving the ionization efficiency and the measurement in repeatability in order to obtain information about a reliable chemical structure, even in the case the sample containing the measurement object molecule is very minute, by using the above sample and method. SOLUTION: The mass analysis-use measurement sample is prepared from a matrix and a sample containing the measurement object molecule, and is characterized by having a wavelike structure whose average period is 1 to 300 nm on at least one portion of its surface. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010203925(A) 申请公布日期 2010.09.16
申请号 JP20090049917 申请日期 2009.03.03
申请人 NOGUCHI INST 发明人 NISHIKAZE TAKASHI;AMANO JUNKO
分类号 G01N27/62 主分类号 G01N27/62
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