发明名称 DETERIORATION DIAGNOSING APPARATUS AND DETERIORATION DIAGNOSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a deterioration diagnosing apparatus capable of inspecting a processing device at proper timing. SOLUTION: A deterioration diagnosing apparatus 100 includes: an inspection means (comprising, e.g., an inspection device 20 and a control device 10) for inspecting a processing device 30 to be inspected; and a deterioration detection means (deterioration detection device 40) for detecting correlation deterioration, which is deterioration of the inspection target that deteriorates in a manner correlated with deterioration of the processing device 30. The inspection means (the inspection device 20 and the control device 10) inspects the processing device 30 when the correlation deterioration is detected by the deterioration detection means (deterioration detection device 40). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010203816(A) 申请公布日期 2010.09.16
申请号 JP20090047523 申请日期 2009.03.02
申请人 NEC CORP 发明人 KAMEDA YOSHIO;SUZUKI KAZUMASA;NOSE KOICHI;NOGUCHI KOICHIRO
分类号 G01R31/30;G01R31/00 主分类号 G01R31/30
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