发明名称 MEASUREMENT APPARATUS
摘要 In a measurement apparatus, higher-quality measurement is realized in measurement of measurement object displacement or imaging of a two-dimensional image. In a controller, a light receiving signal of a photodiode is supplied to a displacement measuring unit of a sensor head in order to measure a height of a measurement object, and the height of a surface of the measurement object is measured based on the light receiving signal. Then, in the controller, image obtaining timing is determined based on the height of the measurement object. Specifically, a focus adjustment value corresponding to the computed height of the measurement object is obtained from the table, and an image obtaining signal is transmitted to an imaging device at the timing the focus adjustment value is realized. Therefore, a length between two points on the measurement object is computed from the thus obtained image based on the height of the measurement object.
申请公布号 US2010232650(A1) 申请公布日期 2010.09.16
申请号 US20100712530 申请日期 2010.02.25
申请人 OMRON CORPORATION 发明人 KANETANI YOSHIHIRO;SUGA TAKAHIRO;TAKIMASA HIROAKI;NAKASHITA NAOYA;IIDA YUSUKE
分类号 G06K9/62 主分类号 G06K9/62
代理机构 代理人
主权项
地址