发明名称 OPTICAL SURFACE MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical surface measuring device and method for measuring surface conditions, such as detailed height variation (bump), concavity and convexity, surface damage, and surface roughness at each site on a surface of an object to be measured. SOLUTION: The optical surface measuring device is characterized by measuring more correctly detailed surface conditions of an object to be measured by utilizing concurrently signals of an interferometer and focal error signals of a PSD. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010204085(A) 申请公布日期 2010.09.16
申请号 JP20090240766 申请日期 2009.10.19
申请人 INDUSTRY-UNIV COOPERATION FOUNDATION SOGANG UNIV 发明人 RI SHOYO;KIM KYOUNG UP;KIM JAE HYUN;CHO KYUMAN;PARK YOUNG KYU
分类号 G01B11/24;G01B9/02;G01B11/30 主分类号 G01B11/24
代理机构 代理人
主权项
地址