发明名称 |
SOCKET, AND TEST APPARATUS AND METHOD USING THE SOCKET |
摘要 |
An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.
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申请公布号 |
US2010231248(A1) |
申请公布日期 |
2010.09.16 |
申请号 |
US20100783722 |
申请日期 |
2010.05.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO BYEONG-HWAN |
分类号 |
G01R31/02;G01R31/26 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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