发明名称 SOCKET, AND TEST APPARATUS AND METHOD USING THE SOCKET
摘要 An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.
申请公布号 US2010231248(A1) 申请公布日期 2010.09.16
申请号 US20100783722 申请日期 2010.05.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO BYEONG-HWAN
分类号 G01R31/02;G01R31/26 主分类号 G01R31/02
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