| 摘要 |
PROBLEM TO BE SOLVED: To arrange an observation point in a critical path (circuit area with small setup delay margin). SOLUTION: This circuit design supporting apparatus includes an observation point specifying section configured to specify a high improvement effect portion of analysis easiness when executing the failure analysis of an integrated circuit as an observation point position. The circuit design supporting apparatus includes an element replacement performing section configured to replace an element arranged at the observation point position by an analysis target element to which a failure analysis apparatus can appropriately conduct the failure analysis on the basis of information of the observation position. COPYRIGHT: (C)2010,JPO&INPIT |
