| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a software error incidence calculation method which calculates the incidence of software errors with a high precision. Ž<P>SOLUTION: The software error incidence calculation method is a method for calculating the incidence of software errors in a semiconductor integrated circuit and includes: a distance calculation step of calculating, as a limited distance, a distance along a well wherein a parasitic bipolar effect may occur, beginning at a diffusion layer wherein a funneling phenomenon has occurred; and a step of determining the occurrence of a software error in a cell including an off-state transistor, in the case where the off-state transistor exists within the limited distance along the well from the diffusion layer wherein the funneling phenomenon has occurred due to the passage of charged particles. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
