| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device and method for testing a circuit component for performing a load test at an optional timing without depending on the timing of a test signal to a circuit component as an object to be tested. Ž<P>SOLUTION: The device for testing the circuit component 10 having a plurality of external terminals T1-T4 includes a plurality of first buffer amplifiers At1-At4 for outputting respective test loads to the plurality of external terminals, a plurality of second buffer amplifiers Am1-Am4 for receiving respective load states of the plurality of external terminals and outputting them as measurement signals M1-M4, and a controlling means 22 for performing control so that the plurality of second buffer amplifiers are sequentially driven to output the measurement signals while the test loads are output from the plurality of first buffer amplifiers. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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