发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device which is formed by using an oxide semiconductor layer and includes a thin-film transistor excellent in electric property. <P>SOLUTION: An In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>is used for a channel formation region, and a source region or a drain region is formed between both a source electrode layer and drain electrode layer, and the In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>in order to reduce a contact resistance between the In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>and a wiring layer formed from a metal material having a low electric resistance. An In-Sn-O based oxide semiconductor layer, which is placed in the same layer and does not include S<SB>i</SB>O<SB>X</SB>, is used for the source region or the drain region, and a pixel region. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010206187(A) 申请公布日期 2010.09.16
申请号 JP20100021013 申请日期 2010.02.02
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 OIKAWA YOSHIAKI;MARUYAMA HODAKA;GOTO HIROMITSU;KAWAE DAISUKE;YAMAZAKI SHUNPEI
分类号 H01L29/786;G02F1/1368;H01L21/336;H01L51/50;H05B33/14 主分类号 H01L29/786
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