发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device which is formed by using an oxide semiconductor layer and includes a thin-film transistor excellent in electric property. <P>SOLUTION: An In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>is used for a channel formation region, and a source region or a drain region is formed between both a source electrode layer and drain electrode layer, and the In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>in order to reduce a contact resistance between the In-Sn-O based oxide semiconductor layer including S<SB>i</SB>O<SB>X</SB>and a wiring layer formed from a metal material having a low electric resistance. An In-Sn-O based oxide semiconductor layer, which is placed in the same layer and does not include S<SB>i</SB>O<SB>X</SB>, is used for the source region or the drain region, and a pixel region. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010206187(A) |
申请公布日期 |
2010.09.16 |
申请号 |
JP20100021013 |
申请日期 |
2010.02.02 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
OIKAWA YOSHIAKI;MARUYAMA HODAKA;GOTO HIROMITSU;KAWAE DAISUKE;YAMAZAKI SHUNPEI |
分类号 |
H01L29/786;G02F1/1368;H01L21/336;H01L51/50;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|