| 发明名称 |
Method for Constructing Shmoo Plots for SRAMS |
| 摘要 |
A method of preparing Shmoo plots where both the number of failures and also the failure type is specified at each test voltage measurement point. A method that uses the operational SRAM array circuitry to determine the type of failure that may have occurred at each test voltage measurement point.
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| 申请公布号 |
US2010232242(A1) |
申请公布日期 |
2010.09.16 |
| 申请号 |
US20090401181 |
申请日期 |
2009.03.10 |
| 申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
DENG XIAOWEI;HOUSTON THEODORE W.;LOH WAH KIT |
| 分类号 |
G11C29/00;G11C7/00;G11C8/08 |
主分类号 |
G11C29/00 |
| 代理机构 |
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代理人 |
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