APPEARANCE INSPECTION SYSTEM

摘要

PURPOSE: An appearance inspection system is intended to stably provide a high precision of location information by the characteristic independent of a carrying device. CONSTITUTION: An appearance inspection system(1) comprises an encoder pattern display part(2) and an inspection device(3). The encoder pattern display part marks on a subject(P) and comprises a Y coordinate pattern(2y) marks the encoder pattern corresponding to the Y coordinate location in the carrying direction of the subject. The inspection system comprises a detection processor(4). The detection processor at least detects an Y coordinate location corresponding to the location of a defective part from a pattern signal(Sp) obtained by taking an image of the encoder pattern display by an image taking part(V) when detecting the defective part. A panel substrate(Po) including one or more flat panels for display is used for the subject. The encoder pattern display part is marked on the blank part(Bp) of the panel substrate.