| 摘要 |
<p>A test apparatus that tests a plurality of device under tests includes: a common pattern generating section that generates a common pattern being the pattern of a test signal common to the plurality of device under tests; an additional pattern storage section that previously stores therein an additional pattern to be added to the common pattern; and an each pattern adding section that reads the additional pattern for each of the device under tests based on a result signal outputted from the device under test and provides the additional pattern added with the common pattern to the device under test.</p> |
